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a) Schematic diagram of the supercritical fluid reaction conditions optimization for VO 2 (M1) synthesis by machine learning. The (b) DTA curves, c) in situ XRD patterns, d) TEM, HRTEM images, and <t>SAED</t> pattern, and (e) XPS spectra of V 2p , O 1s , and N 1s of the single phase VO 2 (M1) obtained by the condition which is optimized by (a). The inset XRD in (a) is the Rietveld test result of the obtained single‐phase VO 2 (M1) (Table , Supporting Information). (c) is composed of the full patterns from 10–60° and the amplified patterns from 64–66°; the inset shows the full patterns ≈65°. The logic of machine learning is shown in Figure (Supporting Information).
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a) Schematic diagram of the supercritical fluid reaction conditions optimization for VO 2 (M1) synthesis by machine learning. The (b) DTA curves, c) in situ XRD patterns, d) TEM, HRTEM images, and SAED pattern, and (e) XPS spectra of V 2p , O 1s , and N 1s of the single phase VO 2 (M1) obtained by the condition which is optimized by (a). The inset XRD in (a) is the Rietveld test result of the obtained single‐phase VO 2 (M1) (Table , Supporting Information). (c) is composed of the full patterns from 10–60° and the amplified patterns from 64–66°; the inset shows the full patterns ≈65°. The logic of machine learning is shown in Figure (Supporting Information).

Journal: Advanced Materials (Deerfield Beach, Fla.)

Article Title: Novel Selectivity: Target of Gas Sensing Defined by Behavior

doi: 10.1002/adma.202413023

Figure Lengend Snippet: a) Schematic diagram of the supercritical fluid reaction conditions optimization for VO 2 (M1) synthesis by machine learning. The (b) DTA curves, c) in situ XRD patterns, d) TEM, HRTEM images, and SAED pattern, and (e) XPS spectra of V 2p , O 1s , and N 1s of the single phase VO 2 (M1) obtained by the condition which is optimized by (a). The inset XRD in (a) is the Rietveld test result of the obtained single‐phase VO 2 (M1) (Table , Supporting Information). (c) is composed of the full patterns from 10–60° and the amplified patterns from 64–66°; the inset shows the full patterns ≈65°. The logic of machine learning is shown in Figure (Supporting Information).

Article Snippet: The transmission electron microscopy (TEM), the high‐resolution transmission electron microscopy (HRTEM) images, and the selected area electron diffraction (SAED) pattern of the morphology and crystal structure of the sample were obtained by TEM (JEM‐2100F, JEOL) operated at 200 kV.

Techniques: In Situ, Amplification